Active Deposition and Penetration

Imaging

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Time of Flight Secondary Ion Mass Spectroscopy (TOF-SIMS) Microscopy

Sometimes, for technical reasons (lack of sensitivity), it will be impossible to visualize active deposition and penetration in the skin or other biological tissues using FTIR microscopy, confocal Raman microscopy, or fluorescence microscopy. In these instances, Time of Flight Secondary Ion Mass Spectroscopy (TOF-SIMS) microscopy might offer a suitable alternative. TOF-SIMS microscopy is not reliant on topical actives having distinct IR or Raman absorption bands and doesn’t usually require the attachment of any markers or tags.